Description
Product overview
Micro-form measuring system combining UMAP ultrasonic micro-probe contact measurement with non-contact vision measurement. Also useful for research labs, prototype engineering, aerospace inspection planning, and high-precision R&D workflows.
Mitutoyo UMAP Vision System TYPE2 Series 364 Micro-form Measuring System is part of the UMAP Vision System TYPE2 path in Mitutoyo Section M. Macroscopic Solutions presents this as a quote-managed product so the measuring range, optics, fixtures, software, accessories, delivery, and installation requirements can be confirmed before purchase.
Key specifications
| Catalog page | M-11 |
|---|---|
| Series | UMAP Vision System TYPE2 Series 364 |
| Z-axis measuring range | 6.89 in / 175 mm for UMAP101/103; 7.07 in / 180 mm for UMAP107/110; 7.28 in / 185 mm for UMAP130 |
| Vision measuring accuracy E1Z | (1.5+2L/1000) um |
| UMAP stylus options | UMAP101 diameter 15 um; UMAP103 diameter 30 um; UMAP107 diameter 70 um; UMAP110 diameter 100 um; UMAP130 diameter 300 um |
| Variation count | 2 |
Applications beyond production metrology
Common applications beyond the factory floor include dimensional verification in university and industrial research labs, prototype engineering, aerospace and aviation component inspection workflows, space-hardware development support, precision fixturing studies, and R&D programs that need repeatable non-contact or coordinate-based measurement.
Application notes are general examples for discovery and planning; confirm suitability, tolerances, fixtures, standards, and regulatory requirements for the specific measurement task.
Applications and selection terms
This product is especially relevant for buyers comparing UMAP, micro-form measuring system, CNC vision measuring system, ultrasonic micro probe, aerospace inspection, aviation inspection, space hardware, research instrumentation, industrial R&D, prototype engineering. The specifications above are redrafted as readable product data so the page can be evaluated by people and search systems without relying on cropped catalog screenshots.
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