Description
Product overview
Twelve-sheet Mitutoyo overlay chart set for inspection with profile projectors using 300mm or larger screen diameters. Also useful for research labs, prototype engineering, aerospace inspection planning, and high-precision R&D workflows.
Mitutoyo Overlay Chart Set for Profile Projectors – 12 Sheets is part of Mitutoyo Section I (Optical Measuring). Macroscopic Solutions supplies this product through a reviewed purchase or quote path so configuration, compatibility, shipping, freight, accessories, and support requirements can be confirmed before fulfillment.
Catalog reference: US-1005 I-14
Quote-only Mitutoyo overlay chart set from catalog page I-14. The catalog lists twelve included chart sheets, preserved below for searchability and quote review.
Key specifications
| Set order number | 12AAM027 |
|---|---|
| Set contents | 12 overlay chart sheets |
| Designed for | Profile projectors with screen diameter of 300mm or larger |
| Catalog page | I-14 |
Included overlay chart sheets
| Chart No. | Pattern |
|---|---|
| 12AAM587 | Protractor, 1-degree radial index, and radius with 1mm-radius increment concentric semicircles |
| 12AAM588 | Radius with 0.1cm-reading scales and 5mm-radius increment concentric circles |
| 12AAM589 | Radius, 1X, 10X, 20X, 50X |
| 12AAM590 | 1mm-reading scales, 20X and 50X |
| 12AAM591 | 10x10mm sections |
| 12AAM592 | 0.5mm-reading scales |
| 12AAM593 | 1x1mm sections |
| 12AAM594 | Protractor, 1-degree diametral index |
| 12AAM595 | 1mm-reading vertical scale |
| 12AAM596 | Protractor, 1-degree diametral index, and radius with 1mm-radius increment concentric circles |
| 12AAM597 | Metric, Unified, and Whitworth screw threads, 20X |
| 12AAM598 | Metric screw thread, 100X, and 20-degree and 14.5-degree gear teeth, 20X |
Applications beyond production metrology
Common applications beyond the factory floor include dimensional verification in university and industrial research labs, prototype engineering, aerospace and aviation component inspection workflows, space-hardware development support, precision fixturing studies, and R&D programs that need repeatable non-contact or coordinate-based measurement.
Application notes are general examples for discovery and planning; confirm suitability, tolerances, fixtures, standards, and regulatory requirements for the specific measurement task.
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