Description
Product overview
Mitutoyo Neck Caliper Series 573 / 536. Quote-only. Also useful for field inspection, prototype measurement, research labs, university labs, and engineering QA.
Mitutoyo Neck Caliper Series 573 / 536 is part of Mitutoyo Section D (Calipers, Height Gages, and Depth Gages). Macroscopic Solutions supplies this product through a reviewed purchase or quote path so configuration, compatibility, shipping, freight, accessories, and support requirements can be confirmed before fulfillment.
Catalog reference: US-1005 D-26
Quote-only Mitutoyo Neck Calipers in ABSOLUTE Digimatic Series 573 and Vernier Series 536 models. Flat-jaw types measure grooves and recesses; point-jaw types measure wall thickness inside bores and recesses.
Specifications
Key specifications
| Order No. | Series | Model | Unit system | Range | Jaw type | Accuracy | Resolution / Graduation | Mass |
|---|---|---|---|---|---|---|---|---|
| 573-651-20 | 573 | ABSOLUTE Digimatic | Metric | 0 – 150mm | Flat jaw | +/-0.03mm | 0.01mm | 157g |
| 573-652-20 | 573 | ABSOLUTE Digimatic | Metric | 0 – 150mm | Point jaw | +/-0.03mm | 0.01mm | 157g |
| 573-751-20 | 573 | ABSOLUTE Digimatic | Inch/Metric | 0 – 6" / 0 – 150mm | Flat jaw | +/-.0015" | .0005" / 0.01mm | 157g |
| 573-752-20 | 573 | ABSOLUTE Digimatic | Inch/Metric | 0 – 6" / 0 – 150mm | Point jaw | +/-.0015" | .0005" / 0.01mm | 157g |
| 536-151 | 536 | Vernier | Metric | 0 – 150mm | Flat jaw | +/-0.05mm | 0.05mm | 140g |
| 536-152 | 536 | Vernier | Metric | 0 – 150mm | Point jaw | +/-0.05mm | 0.05mm | 140g |
Applications beyond production metrology
Common applications beyond production metrology include field and bench inspection for research teams, prototype measurement, university teaching labs, geoscience sample fixture checks, botanical and life-science lab hardware measurement, engineering QA, and oil and gas maintenance or component documentation.
Application notes are general examples for discovery and planning; confirm suitability, tolerances, fixtures, standards, and regulatory requirements for the specific measurement task.
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