Description
Product overview
Mitutoyo Series 152 micrometer heads for XY-stage use. Quote-only. Also useful for field inspection, prototype measurement, research labs, university labs, and engineering QA.
Mitutoyo Micrometer Heads Series 152 – for XY-Stage is part of Mitutoyo Section B (Micrometers). Macroscopic Solutions supplies this product through a reviewed purchase or quote path so configuration, compatibility, shipping, freight, accessories, and support requirements can be confirmed before fulfillment.
Catalog reference: US-1005 B-70
Quote-only Mitutoyo Series 152 micrometer heads for XY-stage use.
Metric Specifications
Key specifications
| Range | Order No. | Accuracy | Stem dia. | Stem | Spindle face | Remarks |
|---|---|---|---|---|---|---|
| 0-25mm | 152-390 | +/-2um | 18mm | Plain | Flat (hardened) with non-rotating device | for X-axis, bidirectional graduation |
| 0-25mm | 152-389 | +/-2um | 18mm | Plain | Flat (hardened) with non-rotating device | for Y-axis, bidirectional graduation |
| 0-25mm | 152-402 | +/-2um | 18mm | Plain | Spherical with carbide tip (SR10) | for X-axis, with vernier; 0.001mm reading obtained with vernier |
| 0-25mm | 152-401 | +/-2um | 18mm | Plain | Spherical with carbide tip (SR10) | for Y-axis, with vernier; 0.001mm reading obtained with vernier |
Inch Specifications
| Range | Order No. | Accuracy | Stem dia. | Stem | Spindle face | Remarks |
|---|---|---|---|---|---|---|
| 0-1" | 152-392 | +/-.0001" | .709" | Plain | Flat (hardened) with non-rotating device | for X-axis, bidirectional graduation |
| 0-1" | 152-391 | +/-.0001" | .709" | Plain | Flat (hardened) with non-rotating device | for Y-axis, bidirectional graduation |
Applications beyond production metrology
Common applications beyond production metrology include field and bench inspection for research teams, prototype measurement, university teaching labs, geoscience sample fixture checks, botanical and life-science lab hardware measurement, engineering QA, and oil and gas maintenance or component documentation.
Application notes are general examples for discovery and planning; confirm suitability, tolerances, fixtures, standards, and regulatory requirements for the specific measurement task.
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