Description
Product overview
Mitutoyo Series 293 high-accuracy sub-micron Digimatic micrometer. Quote-only. Also useful for field inspection, prototype measurement, research labs, university labs, and engineering QA.
Mitutoyo MDH Micrometer Series 293 is part of Mitutoyo Section B (Micrometers). Macroscopic Solutions supplies this product through a reviewed purchase or quote path so configuration, compatibility, shipping, freight, accessories, and support requirements can be confirmed before fulfillment.
Catalog reference: US-1005 B-5
Quote-only Mitutoyo Series 293 MDH high-accuracy sub-micron Digimatic micrometer from catalog US-1005. Select metric or inch/metric order number for quote request.
Technical Data
Key specifications
| Flatness | 0.3 um / .000012 in |
|---|---|
| Parallelism | 0.6 um / .000024 in |
| Measuring force | 7 to 9 N |
| Functions | Preset, Zero-setting, Hold, Resolution switching, Function lock, On/off, Auto power off, Measurement data output, Error alarm |
Metric
| Order No. | Range | Resolution | Accuracy | Measuring surface | Mass |
|---|---|---|---|---|---|
| 293-100-10 | 0 – 25mm | 0.0001mm / 0.0005mm (switchable) | +/-0.5um | Dia. 3.2mm | 400g (440g with heat shield) |
Inch/Metric
| Order No. | Range | Resolution | Accuracy | Measuring surface | Mass |
|---|---|---|---|---|---|
| 293-130-10 | 0 – 1" / 0 – 25.4mm | .000005" / .00002" / 0.0001mm / 0.0005mm (switchable) | +/-.00002" | Dia. 3.2mm | 400g (440g with heat shield) |
Pricing is subject to change. Request a quote for current pricing and availability.
Applications beyond production metrology
Common applications beyond production metrology include field and bench inspection for research teams, prototype measurement, university teaching labs, geoscience sample fixture checks, botanical and life-science lab hardware measurement, engineering QA, and oil and gas maintenance or component documentation.
Application notes are general examples for discovery and planning; confirm suitability, tolerances, fixtures, standards, and regulatory requirements for the specific measurement task.
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