Description
Product overview
Near-infrared radiation corrected M Plan Apo NIR objectives for bright field observation. Also useful for research microscopy, materials imaging, life-science sample inspection, and university lab workflows.
Mitutoyo M Plan Apo NIR Bright Field Objective is part of Mitutoyo Section I (Optical Measuring). Macroscopic Solutions supplies this product through a reviewed purchase or quote path so configuration, compatibility, shipping, freight, accessories, and support requirements can be confirmed before fulfillment.
Catalog reference: US-1005 I-33
Key specifications
Specification details are confirmed during quote review for this Mitutoyo product.
Quote-only objective family from Mitutoyo US-1005 page I-33. Official order numbers are preserved as variation SKUs.
Designed so the workpiece image can be focused within focal depth across visible to near-infrared wavelengths; HR objective SKUs are marked with an asterisk in the catalog.
Applications beyond production metrology
Common applications beyond production metrology include research microscopy, materials-science imaging, failure analysis, life-science sample inspection, botany lab documentation, and university teaching labs where repeatable optical measurement or inspection is useful.
Application notes are general examples for discovery and planning; confirm suitability, tolerances, fixtures, standards, and regulatory requirements for the specific measurement task.
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