Description
Product overview
Mitutoyo LH-600E Optional Probes and Accessories. Quote-only. Also useful for field inspection, prototype measurement, research labs, university labs, and engineering QA.
Mitutoyo LH-600E Optional Probes and Accessories is part of Mitutoyo Section D (Calipers, Height Gages, and Depth Gages). Macroscopic Solutions supplies this product through a reviewed purchase or quote path so configuration, compatibility, shipping, freight, accessories, and support requirements can be confirmed before fulfillment.
Catalog reference: US-1005 D-37
Quote-only optional probes, holders, cables, calibration blocks, and accessories for Mitutoyo LH-600E Series 518 Linear Height systems.
Catalog Options
Key specifications
| Order No. | Group | Description |
|---|---|---|
| 12AAF712 | Optional accessory | Battery pack |
| 12AAA797 | Optional accessory | Thermal printer (120V) |
| 12AAA802 | Optional accessory | Thermal printing paper (10pcs.) |
| 12AAA804 | Optional accessory | Cable for page printer (2m) |
| 12AAA807 | Optional accessory | RS-232C cable (80" / 2m) |
| 12AAA808 | Optional accessory | RS-232C cable (160" / 4m) |
| 12AAA792 | Optional accessory | Dial indicator (8mm stem) holder |
| 12AAA837 | Optional accessory | Dial indicator (3/8" stem) holder |
| 932361 | Optional accessory | Mu-checker lever head holder |
| 12AAA787 | Calibration block | Block for calibrating probe diameter (applicable to taper probe) |
| K650986 | Stylus kit | Styli Kit M3 |
| 12AAF666 | Probe | 1mm ball probe |
| 957261 | Probe | 2mm ball probe |
| 12AAF667 | Probe | 2mm ruby ball probe |
| 957262 | Probe | 3mm ball probe |
| 957263 | Probe | 4mm ball probe |
| 12AAB552 | Probe | 10mm ball probe, L=55 |
| 12AAF668 | Probe | 10mm ball probe, L=82 |
| 12AAF669 | Probe | 10mm ball probe, L=120 |
| 12AAF670 | Probe | 5mm disk probe |
| 12AAF671 | Probe | 10mm disk probe |
| 957264 | Probe | 14mm disk probe |
| 957265 | Probe | 20mm disk probe |
| 12AAF672 | Probe | 1mm ball offset probe with test indicator stylus (103017) |
| 12AAF673 | Probe | 2mm ball offset probe with 2mm carbide ball |
| 12AAA788 | Probe | 4mm ball offset probe |
| 12AAA789 | Probe | 6mm ball offset probe |
| 226117 | Probe adapter | M2 CMM stylus adapter M2 |
| 226118 | Probe adapter | M3 CMM stylus adapter M3 |
| 12AAC072 | Probe | Depth probe |
| 12AAC073 | Probe | 20mm taper probe |
| 12AAB136 | Probe | 10mm cylindrical probe |
| 12AAA793 | Probe holder | Probe extension holder (85mm / 3.3 inch) |
Applications beyond production metrology
Common applications beyond production metrology include field and bench inspection for research teams, prototype measurement, university teaching labs, geoscience sample fixture checks, botanical and life-science lab hardware measurement, engineering QA, and oil and gas maintenance or component documentation.
Application notes are general examples for discovery and planning; confirm suitability, tolerances, fixtures, standards, and regulatory requirements for the specific measurement task.
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