Description
Product overview
Mitutoyo crimp height micrometers with point spindle and blade anvil for measuring crimp-contact height. Quote-only. Also useful for field inspection, prototype measurement, research labs, university labs, and engineering QA.
Mitutoyo Crimp Height Micrometers Series 342 / 142 / 112 is part of Mitutoyo Section B (Micrometers). Macroscopic Solutions supplies this product through a reviewed purchase or quote path so configuration, compatibility, shipping, freight, accessories, and support requirements can be confirmed before fulfillment.
Catalog reference: US-1005 B-22
Quote-only Mitutoyo crimp height micrometers from catalog US-1005. Series 342 digital, Series 142 mechanical counter, and Series 112 analog models are grouped here by model type.
Technical Data
Key specifications
| Accuracy | Refer to specifications table |
|---|---|
| Resolution, digital | .00005" / 0.001mm or 0.001mm |
| Graduation, analog | 0.01mm |
| Dust/water protection | IP65 / IP54 for Series 342 digital models |
| Battery life | Approx. 2.4 years under normal use; 3 years for Quickmike type |
| Blade anvil detail | 0.5 (1), 60 deg (27 deg); values in parentheses are for Series 142 |
Specifications
| Model group | Range | Resolution/Graduation | Order No. | Accuracy | Mass | Notes |
|---|---|---|---|---|---|---|
| Series 342 Metric Digital Model | 0 – 20mm | 0.001mm | 342-271-30 | +/-3um | 270g | IP65 digital model |
| Series 342 Inch/Metric Digital Model | 0 – 0.8" / 0 – 20mm | .00005" / 0.001mm | 342-371-30 | +/-.00015" | 270g | IP65 digital model |
| Series 342 Metric Quickmike Type | 0 – 15mm | 0.001mm | 342-451 | +/-3um | 275g | IP54 Quickmike type |
| Series 142 Metric Mechanical Counter Model | 0 – 25mm | 0.01mm | 142-402 | +/-3um | 200g | Mechanical counter model |
| Series 142 Metric Mechanical Counter Model | 0 – 25mm | 0.001mm | 142-403 | +/-3um | 200g | 0.001mm reading is obtained with vernier |
| Series 112 Metric Analog Model | 0 – 25mm | 0.01mm | 112-401 | +/-3um | 165g | Analog model |
Pricing is subject to change. Request a quote for current pricing and availability.
Applications beyond production metrology
Common applications beyond production metrology include field and bench inspection for research teams, prototype measurement, university teaching labs, geoscience sample fixture checks, botanical and life-science lab hardware measurement, engineering QA, and oil and gas maintenance or component documentation.
Application notes are general examples for discovery and planning; confirm suitability, tolerances, fixtures, standards, and regulatory requirements for the specific measurement task.
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